Struct opentelemetry::sdk::trace::SpanLimits
source · pub struct SpanLimits {
pub max_events_per_span: u32,
pub max_attributes_per_span: u32,
pub max_links_per_span: u32,
pub max_attributes_per_event: u32,
pub max_attributes_per_link: u32,
}
Expand description
Span limit configuration to keep attributes, events and links to a span in a reasonable number.
Fields§
§max_events_per_span: u32
The max events that can be added to a Span
.
max_attributes_per_span: u32
The max attributes that can be added to a Span
.
max_links_per_span: u32
The max links that can be added to a Span
.
max_attributes_per_event: u32
The max attributes that can be added into an Event
max_attributes_per_link: u32
The max attributes that can be added into a Link
Trait Implementations§
source§impl Clone for SpanLimits
impl Clone for SpanLimits
source§fn clone(&self) -> SpanLimits
fn clone(&self) -> SpanLimits
Returns a copy of the value. Read more
1.0.0 · source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source
. Read moresource§impl Debug for SpanLimits
impl Debug for SpanLimits
source§impl Default for SpanLimits
impl Default for SpanLimits
source§impl<'de> Deserialize<'de> for SpanLimits
impl<'de> Deserialize<'de> for SpanLimits
source§fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where
__D: Deserializer<'de>,
fn deserialize<__D>(__deserializer: __D) -> Result<Self, __D::Error>where __D: Deserializer<'de>,
Deserialize this value from the given Serde deserializer. Read more
source§impl Serialize for SpanLimits
impl Serialize for SpanLimits
impl Copy for SpanLimits
Auto Trait Implementations§
impl RefUnwindSafe for SpanLimits
impl Send for SpanLimits
impl Sync for SpanLimits
impl Unpin for SpanLimits
impl UnwindSafe for SpanLimits
Blanket Implementations§
source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere T: ?Sized,
source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more